A frequency-metrology laboratory must resolve the two hyperfine components of the…
PHYSICS · Multi-part · Fermi University Physics · Optics & Photonics · Interference and diffraction · Interference and diffraction
Optics and Photonics, Ch Fraunhofer diffraction from apertures and gratings
Problem
A frequency-metrology laboratory must resolve the two hyperfine components of the 632.8nm line from a stabilised helium-neon laser, separated by Δλ=2.0×10−3nm. The instrument only ever needs to display a window 0.050nm wide around the line. Two candidates are available: a diffraction grating ruled at 1200 lines per millimetre, and an air-spaced Fabry-Perot etalon of finesse F=30 whose plate spacing d can be chosen freely. The grating is used in first order; for the etalon, the order m and free spectral range are related, as for any such device, by ΔλFSR=λ/m, and the plate spacing sets the order through m=2d/λ at normal incidence.
((a)) Find the resolving power λ/Δλ the instrument must supply.
((b)) For the grating, find the number of illuminated lines N needed in first order and the corresponding minimum illuminated width, and comment on whether this is a practical size.
((c)) For the etalon, use its resolving power mF to find the order m needed, then the plate spacing d=mλ/2, and check that the resulting free spectral range λ2/(2d) is at least as large as the 0.050nm window that must be displayed.
((d)) State which device should be used.