An atomic-force-microscope cantilever at is calibrated from its thermal motion alone
PHYSICS · Multi-part · Fermi University Physics · Computational Physics · Electronics, Instrumentation & Communication · Scientific programming for physicists
Scientific Computing for Physicists, Ch Spectra with error bars: the fast transform, convolution and spectral estimation
Problem
An atomic-force-microscope cantilever at T=295K is calibrated from its thermal motion alone. Its tip deflection x is recorded at fs=200kHz for 10s. The cantilever behaves as one harmonic oscillator of stiffness k=mω02, with its resonance near 20kHz and a full width at half maximum Γ=400Hz, so equipartition gives ⟨21kx2⟩=21kBT.
((a)) The thermal peak of the one-sided deflection PSD, with the detector's flat noise floor subtracted, has area 5.0×10−20m2. Explain why that area is ⟨x2⟩, and find the stiffness k.
((b)) The PSD is estimated by Welch's method with untapered, non-overlapping segments, treated as independent. Choose the shortest power-of-two segment length M whose frequency resolution is no coarser than Γ/10, so that the peak spans at least ten bins. State the resolution, the number of whole segments K the record provides, and the relative uncertainty of each bin of the estimate.
((c)) The detector adds a flat floor of 1.0×10−26m2Hz−1 from 0 to the Nyquist frequency. If the whole PSD were integrated without subtracting that floor, by what fraction would the stiffness come out wrong, and in which direction?