Tabulated X-ray atomic form factor values for silicon are ,

PHYSICS · Multi-part · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Crystal structure, bonding and diffraction · Crystal structure, bonding and diffraction

Solid State Physics, Ch Diffraction as measurement: form factors, thermal motion and refinement

Problem

Tabulated X-ray atomic form factor values for silicon are

f=14.0

9.7

7.2

and

5.3

electrons at

\sin\theta/\lambda=0

0.2

0.4

and

0.6\,\mathrm{\AA^{-1}}

respectively. Assuming the multiplicity, Lorentz, polarisation, absorption and Debye-Waller factors are the same for two reflections, the ratio of their integrated intensities equals the ratio of

|f|^2

. ((a)) Find the ratio

I(\sin\theta/\lambda=0.6)/I(\sin\theta/\lambda=0.2)

. ((b)) State in one sentence what physical effect this ratio illustrates.

Browse the problem library