Boron is diffused into silicon at for from a source held at the surface

PHYSICS · Subjective · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Crystal structure, bonding and diffraction · Crystal structure, bonding and diffraction

Solid State Physics, Ch Point defects, dislocations and alloys

Problem

Boron is diffused into silicon at 1000 ∘C1000\,\mathrm{^{\circ}C} for 1 hour1\,\mathrm{hour} from a source held at the surface. Its diffusion coefficient follows D=D0e−Q/kBTD = D_0e^{-Q/k_BT} with D0=7.6×10−5 m2 s−1D_0 = 7.6\times10^{-5}\,\mathrm{m^2\,s^{-1}} and Q=3.46 eVQ = 3.46\,\mathrm{eV}. Using the matching solution of the diffusion equation, calculate the diffusion length Dt\sqrt{Dt} for this anneal.

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