Boron is diffused into silicon at for from a source held at the surface
PHYSICS · Subjective · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Crystal structure, bonding and diffraction · Crystal structure, bonding and diffraction
Solid State Physics, Ch Point defects, dislocations and alloys
Problem
Boron is diffused into silicon at 1000∘C for 1hour from a source held at the surface. Its diffusion coefficient follows D=D0e−Q/kBT with D0=7.6×10−5m2s−1 and Q=3.46eV. Using the matching solution of the diffusion equation, calculate the diffusion length Dt for this anneal.