A cyclotron resonance experiment on silicon at a fixed microwave frequency of shows…
PHYSICS · Multi-part · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Free electrons, energy bands and electronic structure · Semiconductor physics and devices
Solid State Physics, Ch Semiconductors: masses, statistics, defect levels and mobility
Problem
A cyclotron resonance experiment on silicon at a fixed microwave frequency of 35.0GHz shows two hole resonances at B1=0.200T and B2=0.613T.
((a)) Compute the cyclotron mass for each line and assign each to the heavy-hole or light-hole branch, given silicon's masses mhh=0.49me and mlh=0.16me.
((b)) A separate p-type silicon sample doped with NA=2.0×1015cm−3 of boron gives hole densities p=1.8×1014cm−3 at 60K, p=1.95×1015cm−3 at 150K, and p=1.2×1016cm−3 at 650K. Identify the regime at each temperature, with your reasoning.
((c)) The hole mobility of the same sample is measured as 1.2×104cm2V−1s−1 at 50K, a maximum of 1.6×104cm2V−1s−1 at 100K, and 5.0×102cm2V−1s−1 at 300K. State which scattering mechanism dominates on each side of the maximum.