A cyclotron resonance experiment on silicon at a fixed microwave frequency of shows…

PHYSICS · Multi-part · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Free electrons, energy bands and electronic structure · Semiconductor physics and devices

Solid State Physics, Ch Semiconductors: masses, statistics, defect levels and mobility

Problem

A cyclotron resonance experiment on silicon at a fixed microwave frequency of 35.0 GHz35.0\,\mathrm{GHz} shows two hole resonances at B1=0.200 TB_1=0.200\,\mathrm{T} and B2=0.613 TB_2=0.613\,\mathrm{T}. ((a)) Compute the cyclotron mass for each line and assign each to the heavy-hole or light-hole branch, given silicon's masses mhh=0.49 mem_{hh}=0.49\,m_e and mlh=0.16 mem_{lh}=0.16\,m_e. ((b)) A separate p-type silicon sample doped with NA=2.0×1015 cm−3N_A=2.0\times10^{15}\,\mathrm{cm^{-3}} of boron gives hole densities p=1.8×1014 cm−3p=1.8\times10^{14}\,\mathrm{cm^{-3}} at 60 K60\,\mathrm{K}, p=1.95×1015 cm−3p=1.95\times10^{15}\,\mathrm{cm^{-3}} at 150 K150\,\mathrm{K}, and p=1.2×1016 cm−3p=1.2\times10^{16}\,\mathrm{cm^{-3}} at 650 K650\,\mathrm{K}. Identify the regime at each temperature, with your reasoning. ((c)) The hole mobility of the same sample is measured as 1.2×104 cm2 V−1s−11.2\times10^{4}\,\mathrm{cm^2\,V^{-1}s^{-1}} at 50 K50\,\mathrm{K}, a maximum of 1.6×104 cm2 V−1s−11.6\times10^{4}\,\mathrm{cm^2\,V^{-1}s^{-1}} at 100 K100\,\mathrm{K}, and 5.0×102 cm2 V−1s−15.0\times10^{2}\,\mathrm{cm^2\,V^{-1}s^{-1}} at 300 K300\,\mathrm{K}. State which scattering mechanism dominates on each side of the maximum.

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