In an n-type silicon sample the electron mobility is limited by two independent…
PHYSICS · Multi-part · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Electronic transport in solids · Semiconductor physics and devices
Solid State Physics, Ch Semiconductors: masses, statistics, defect levels and mobility
Problem
In an n-type silicon sample the electron mobility is limited by two independent scattering mechanisms whose rates add by Matthiessen's rule. At a reference temperature T0=100K the ionised-impurity-limited mobility is μI(T0)=2000cm2V−1s−1 and the phonon-limited mobility is μph(T0)=6000cm2V−1s−1, with μI(T)=μI(T0)(T/T0)3/2 and μph(T)=μph(T0)(T/T0)−3/2 over the temperature range of interest.
((a)) Starting from the energy dependence of the screened-Coulomb (Rutherford-like) scattering time τ(E)∝E3/2/NI for an ionised-impurity density NI, and using the thermal average appropriate to a non-degenerate carrier gas, derive the temperature dependence μn,I∝T3/2/NI quoted above.
((b)) Find the temperature T1 at which μI(T1)=μph(T1), and the combined mobility, by Matthiessen's rule, at that temperature.