A thin, pseudomorphic layer of n-type ( , band gap at ) is grown, below its critical…

PHYSICS · Multi-part · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Semiconductor physics and devices · Semiconductor physics and devices

Solid State Physics, Ch Heterostructures, quantum wells and the two-dimensional electron gas

Problem

A thin, pseudomorphic layer of n-type In0.15Ga0.85As\mathrm{In_{0.15}Ga_{0.85}As} (Nd=2.0×1017 cm−3N_d=2.0\times10^{17}\,\mathrm{cm^{-3}}, band gap Eg=1.24 eVE_g=1.24\,\mathrm{eV} at 300 K300\,\mathrm{K}) is grown, below its critical thickness, on a p-type GaAs substrate (Na=1.0×1017 cm−3N_a=1.0\times10^{17}\,\mathrm{cm^{-3}}, Eg=1.424 eVE_g=1.424\,\mathrm{eV}). The measured conduction-to-valence offset split for this pair is ΔEC:ΔEV=70:30\Delta E_C:\Delta E_V=70:30. ((a)) Find ΔEC\Delta E_C and ΔEV\Delta E_V at this interface. ((b)) State, with a reason, whether this is a type-I or type-II alignment, and describe qualitatively how ECE_C, EVE_V and EFE_F run across the structure (which side depletes, and what happens to each band edge at the interface itself, over and above the depletion-region bending set by the doping as in an ordinary p-n diode). ((c)) Because the InGaAs layer has a larger relaxed lattice constant than GaAs, growing it pseudomorphically on GaAs puts it under biaxial compression (a misfit-strain effect). Using the picture of the degenerate heavy- and light-hole bands at k=0\mathbf{k}=0 in an unstrained cubic semiconductor, explain what this strain does to the two bands and which one becomes the valence-band edge.

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