A thin, pseudomorphic layer of n-type ( , band gap at ) is grown, below its critical…
PHYSICS · Multi-part · Fermi University Physics · Condensed Matter, Materials & Soft Matter · Semiconductor physics and devices · Semiconductor physics and devices
Solid State Physics, Ch Heterostructures, quantum wells and the two-dimensional electron gas
Problem
A thin, pseudomorphic layer of n-type In0.15Ga0.85As (Nd=2.0×1017cm−3, band gap Eg=1.24eV at 300K) is grown, below its critical thickness, on a p-type GaAs substrate (Na=1.0×1017cm−3, Eg=1.424eV). The measured conduction-to-valence offset split for this pair is ΔEC:ΔEV=70:30.
((a)) Find ΔEC and ΔEV at this interface.
((b)) State, with a reason, whether this is a type-I or type-II alignment, and describe qualitatively how EC, EV and EF run across the structure (which side depletes, and what happens to each band edge at the interface itself, over and above the depletion-region bending set by the doping as in an ordinary p-n diode).
((c)) Because the InGaAs layer has a larger relaxed lattice constant than GaAs, growing it pseudomorphically on GaAs puts it under biaxial compression (a misfit-strain effect). Using the picture of the degenerate heavy- and light-hole bands at k=0 in an unstrained cubic semiconductor, explain what this strain does to the two bands and which one becomes the valence-band edge.